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Creators/Authors contains: "Di, Mengfu"

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  1. ; ; ; (, Proc. IEEE Electron Devices Technology and Manufacturing Conference (EDTM))
    CDM ESD protection is a major ESD protection design challenge for advanced ICs, often suffering from random design failures. It was recently reported that the traditional pad-based CDM ESD protection method is fundamentally faulty, contributing to design uncertainties in CDM ESD testing and field failures. This paper reports a novel internally distributed CDM ESD protection method to overcome this major design challenge, which was validated using an internal-CDM-protected oscillator IC implemented in a foundry 45nm SOI CMOS technology. ESD protection is required for all systems. 
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  2. ; ; ; ; ; ; (, IEEE Journal of the Electron Devices Society)
    null (Ed.)
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  3. ; ; ; ; ; ; ; (, Journal of Communications)
    null (Ed.)
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